Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
            
            
                
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                            Citation:
                        
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                        Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
                        
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                Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
            
            
                
                    | 
                        
                            Citation:
                        
                     | 
                    
                        Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
                        
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