Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
Citation:
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Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
|
Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
Citation:
|
Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
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