Lei Chen, Zhi-Ping Wen, Zhi-Quan Zhang, Min Wang. A Novel BIST Approach for Testing Input/Output Buffers in SoCs[J]. Journal of Electronic Science and Technology, 2009, 7(4): 322-325.
Citation: Lei Chen, Zhi-Ping Wen, Zhi-Quan Zhang, Min Wang. A Novel BIST Approach for Testing Input/Output Buffers in SoCs[J]. Journal of Electronic Science and Technology, 2009, 7(4): 322-325.

A Novel BIST Approach for Testing Input/Output Buffers in SoCs

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