Fan Min, William Zhu. Attribute Reduction with Test Cost Constraint[J]. Journal of Electronic Science and Technology, 2011, 9(2): 97-102. DOI: 10.3969/j.issn.1674-862X.2011.02.001
Citation:
|
Fan Min, William Zhu. Attribute Reduction with Test Cost Constraint[J]. Journal of Electronic Science and Technology, 2011, 9(2): 97-102. DOI: 10.3969/j.issn.1674-862X.2011.02.001
|
Fan Min, William Zhu. Attribute Reduction with Test Cost Constraint[J]. Journal of Electronic Science and Technology, 2011, 9(2): 97-102. DOI: 10.3969/j.issn.1674-862X.2011.02.001
Citation:
|
Fan Min, William Zhu. Attribute Reduction with Test Cost Constraint[J]. Journal of Electronic Science and Technology, 2011, 9(2): 97-102. DOI: 10.3969/j.issn.1674-862X.2011.02.001
|