Volume 6 Issue 2
Apr.  2017
Article Contents

Hui-Bin Zhao, Jian-Xun Jin, Pu-Chun Jiang, Wen-Hui Gao, Zi-Lu Liang. LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms[J]. Journal of Electronic Science and Technology, 2008, 6(2): 198-204.
Citation: Hui-Bin Zhao, Jian-Xun Jin, Pu-Chun Jiang, Wen-Hui Gao, Zi-Lu Liang. LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms[J]. Journal of Electronic Science and Technology, 2008, 6(2): 198-204.

LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms

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  • Author Bio:

    Hui-Bin Zhao research interest is in high temperature superconducting characteristic test, rainyroadhb@126.com;
    Jian-Xun Jin, jxjin@uestc.edu.cn

    Hui-Bin Zhao research interest is in high temperature superconducting characteristic test, rainyroadhb@126.com;
    Jian-Xun Jin, jxjin@uestc.edu.cn

  • Received Date: 2008-03-15
  • Rev Recd Date: 2008-04-03
  • Publish Date: 2008-06-25

通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms

  • Author Bio:

Abstract: This paper introduces the relevant parameters and related characteristics of the LabVIEW and PCI6221 data acquisition (DAQ) card, describes in detail the approach of building the measure and control platform of virtual instrument (VI) using LabVIEW and PCI6221, specifically discusses the system's application in high temperature superconductor (HTS) research including the test of HTS volt-ampere characteristics and the HTS magnetic energy storage. The experiments prove that the VI test and control system is easy to build and convenient to use.

Hui-Bin Zhao, Jian-Xun Jin, Pu-Chun Jiang, Wen-Hui Gao, Zi-Lu Liang. LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms[J]. Journal of Electronic Science and Technology, 2008, 6(2): 198-204.
Citation: Hui-Bin Zhao, Jian-Xun Jin, Pu-Chun Jiang, Wen-Hui Gao, Zi-Lu Liang. LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms[J]. Journal of Electronic Science and Technology, 2008, 6(2): 198-204.

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