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Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
Citation: Cheng Zeng, Zheng-Xiang Luo, Qi-Shao Zhang, Kai Yang. Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J]. Journal of Electronic Science and Technology, 2008, 6(2): 212-215.
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Design of TE01Δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film

  • School of Optoelectronic Information,University of Electronic Science and Technology of China,Chengdu,610054,China

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This work was supported by the National 863 Foundation of China under Grant No. TC265-C304.

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  • Author Bio:

    Cheng Zeng research interests include the measurement of HTS, and HTS passive devices, zenghijk@uestc.edu.cn;
    Zheng-Xiang Luo, zxluo@uestc.edu.cn

    Cheng Zeng research interests include the measurement of HTS, and HTS passive devices, zenghijk@uestc.edu.cn;
    Zheng-Xiang Luo, zxluo@uestc.edu.cn

  • Received Date: 2007-12-24
  • Rev Recd Date: 2008-02-04
  • Publish Date: 2008-06-24
    Abstract
  • A new TE01 test probe with proper transmission factor is fabricated for the measurement of surface resistance of high temperature superconductor (HTS) thin film. Coupling holes instead of coupling loops are used in the probe for its easier machining and relatively low loss. Two 6 mm3 mm8 mm dielectric waveguides, one side of them is coated by silver, are used for coupling. The measurement result of S21 agrees well with the simulation because the size of the probe can be rigidly controlled by machine. The microwave surface resistance of four YBCO/MgO films are measured at 77 K and 12 GHz and scaled to 10 GHz according to the f2 rule. The average surface resistance of four HTS thin films is 0.38 m, the standard deviation and relative standard deviation of one single HTS thin film are 0.009 m and 2.4%, respectively.
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